Oxide/InAs(001) interface passivation with fluorine
Aksenov M. S.1,2, Golyashov V.A.1,2, Tereshchenko O.E.1,2
1Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia
2Novosibirsk State University, Novosibirsk, Russia
Email: aksenov@isp.nsc.ru, golyashov@isp.nsc.ru, teresh@isp.nsc.ru

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It is shown that fluorine-containing anodic layers on the n-InAs(001) surface, in contrast to fluorine-free anodic layers, form an interface with unpinned Fermi level, the density of states on which near the midgap is about 1011 eV-1· cm-2 (78 K ). The study of the chemical composition showed that the decrease in the density of states is associated with the formation of indium and arsenic oxyfluorides near the interface. Keywords: InAs, MIS structure, fluorine, anodic layer, interface states.
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