Technical Physics

To authors

Volumes and Issues

2024
- 1 2 3 4 5 6 7 8 9 10 11
2023
- 1 2 3 4 5 6 7 8 9 10 11 12
2022
- 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15

Design of a high-resolution VLS monochromator for synchrotron radiation

Russian version

DOI: 10.21883/TP.2022.13.52230.86-21

Shatokhin A. N. ¹, Vishnyakov E. A. ¹, Kolesnikov A. O. ¹, Nikolenko A. D.^2,3, Ragozin E. N. ¹

¹Lebedev Physical Institute, Russian Academy of Sciences, Moscow, Russia
²Budker Institute of Nuclear Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia
³Boreskov Institute of Catalysis, Siberian Branch of RAS, Novosibirsk, Russia

Email: shatohinal@gmail.com, juk301@mail.ru, alexey6180@gmail.com, enragozin@gmail.com

PDF

Abstract
References
Статистика просмотров

A high-resolution monochromator with a broad spectral range of 125-4200 Angstrem is designed for a measuring beamline of the projected synchrotron radiation source "SKIF" (Novosibirsk). The optical configuration of the monochromator comprises a grazing-incidence concave mirror, a plane VLS grating, and an exit slit. It is planned to use two replaceable VLS gratings with central groove frequencies of 600 and 150 mm^-1 intended for subranges of 125-1000 Angstrem and 900-4200 Angstrem, respectively. Wavelength tuning in each of the two subranges is carried out by solely the rotation of the VLS-gratings. Due to the proper choice of p₁ VLS-grating coefficients, the focal distance varies only slightly over the entire spectral range, and the p₂ VLS-grating coefficients are used to suppress the aberrations of the mirror and the gratings. The resolving power of the configuration obtained by numerical ray tracing exceeds 1000 in the 125-1000 Angstrem range and 2000 in the 900-4200 Angstrem range. Keywords: VUV, spectroscopy, VLS-grating, synchrotron radiation.

A.V. Bukhtiyarov, V.I. Bukhtiyarov, A.D. Nikolenko, I.P. Prosvirin, R.I. Kvon, O.E. Tereshchenko. AIP Conf. Proc., 2299, 060003 (2020). DOI: 10.1063/5.0030740
W.R. Hunter, R.T. Williams, J.C. Rife, J.P. Kirkland, M.N. Kabler. Nucl. Instrum. Meth., 195, 141 (1982). DOI: 10.1016/0029-554X(82)90768-6
M.C. Hettrick, J.H. Underwood. AIP Conf. Proc., 147, 237 (1986). DOI: 10.1063/1.35993
M.C. Hettrick, J.H. Underwood, P. Batson, M. Eckart. Appl. Opt., 27 (2), 200 (1988). DOI: 10.1364/AO.27.000200
P. Miotti, N. Fabris, F. Frassetto, C. Spezzani, L. Poletto. AIP Conf. Proc., 2054, 060023 (2019); DOI: 10.1063/1.5084654
E.A. Vishnyakov, A.O. Kolesnikov, A.S. Pirozhkov, E.N. Ragozin, A.N. Shatokhin. Quant. Electron., 48 (10), 916 (2018) [E.A. Vishnyakov, A.O. Kolesnikov, A.S. Pirozhkov, E.N. Ragozin, A.N. Shatokhin. Quant. Electron., 48 (10), 916 (2018)]. DOI: 10.1070/QEL16707
E.N. Ragozin, E.A. Vishnyakov, A.O. Kolesnikov, A.S. Pirozhkov, A.N. Shatokhin. Phys. Usp., 191 (5), 522 (2021). [E.N. Ragozin, E.A. Vishnyakov, A.O. Kolesnikov, A.S. Pirozhkov, A.N. Shatokhin. Phys. Usp., 191 (5), 522 (2021). DOI: 10.3367/UFNe.2020.06.038799]
J. Dunn, E.W. Magee, R. Shepherd, H. Chen, S.B. Hansen, S.J. Moon, G.V. Brown, M.-F. Gu, P. Beiersdorfer, M.A. Purvis. Rev. Sci. Instrum., 79, 10E314 (2008). DOI: 10.1063/1.2968704
T. Harada, H. Sakuma, K. Takahashi, T. Watanabe, H. Hara, T. Kita. Appl. Opt., 37 (28), 6803 (1998). DOI: 10.1364/AO.37.006803
M.C. Hettrick, S. Bowyer. Appl. Opt., 22 (24), 3921 (1983). DOI: 10.1364/AO.22.003921
M.C. Hettrick, S. Bowyer, R.F. Malina, C. Martin, S. Mrowka. Appl. Opt. 24 (12), 1737 (1985). DOI: 10.1364/AO.24.001737
A. Miyake, T. Miyachi, M. Amemiya, T. Hasegawa, N. Ogushi, T. Yamamoto, F. Masaki, Y. Watanabe. Proc. SPIE, 5037, 647 (2003). DOI: 10.1117/12.484969
M. Terauchi, S. Koshiya, F. Satoh, H. Takahashi, N. Handa, T. Murano, M. Koike, T. Imazono, M. Koeda, T. Nagano, H. Sasai, Y. Oue, Z. Yonezawa, S. Kuramoto. Microsc. Microanal., 20, 692 (2014). DOI: 10.1017/S1431927614000439
J.H. Underwood, E.M. Gullikson, M. Koike, S. Mrowka. Proc. SPIE, 3150, 40 (1997). DOI: 10.1117/12.292734
J.-J. Wang, Y.E. Mao, T. Shi, R. Chang, S. Qiao. Chin. Phys. C, 39 (4), 048001 (2015)
L. Du, X. Du, Q. Wang, J. Zhong. Nucl. Instrum. Meth. A, 877, 65 (2018). DOI: 10.1016/j.nima.2017.09.045
O. Fuchs, L. Weinhardt, M. Blum, M. Weigand, E. Umbach, M. Bar, C. Heske, J. Denlinger, Y.-D. Chuang, W. McKinney, Z. Hussain, E. Gullikson, M. Jones, P. Batson, B. Nelles, R. Follath. Rev. Sci. Instrum., 80, 063103 (2009) DOI: 10.1063/1.3133704
T. Warwick, Y.-D. Chuang, D.L. Voronov, H.A. Padmore. J. Synchrotron Radiat., 21, 736 (2014). DOI: 10.1107/S1600577514009692
J. Dvorak, I. Jarrige, V. Bisogni, S. Coburn, W. Leonhardt. Rev. Sci. Instrum., 87, 115109 (2016). DOI: 10.1063/1.4964847
M.A. Cornu. Comptes Rendus Acad. Sci., 117, 1032 (1893)
T. Harada, S. Moriyama, T. Kita. Jpn. J. Appl. Phys., 14 (51), 175 (1975). DOI:10.7567/JJAPS.14S1.175
T. Harada, T. Kita. Appl. Opt., 19 (23), 3987 (1980). DOI: 10.1364/AO.19.003987
T. Kita, T. Harada. Appl. Opt., 31 (10), 1399 (1992). DOI: 10.1364/AO.31.001399
T. Kita, T. Harada, N. Nakano, H. Kuroda. Appl. Opt., 22 (4), 512 (1983). DOI: 10.1364/AO.22.000512
Hettrick Scientific [Electronic source] Available at: http://hettrickscientific.com/
A.O. Kolesnikov, E.A. Vishnyakov, A.N. Shatokhin, E.N. Ragozin. Quant. Electron., 49 (11), 1054 (2019). [A.O. Kolesnikov, E.A. Vishnyakov, A.N. Shatokhin, E.N. Ragozin. Quant. Electron., 49 (11), 1054 (2019). DOI: 10.1070/QEL17074]
A.N. Shatokhin, A.O. Kolesnikov, P.V. Sasorov, E.A. Vishnyakov, E.N. Ragozin. Opt. Express, 26 (15), 19009 (2018). DOI: 10.1364/OE.26.019009
ESRF. XOP (X-ray Oriented Programs) [Electronic source] Available at: https://www.esrf.fr/Instrumentation/ software/ data-analysis/xop2.3

Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.

Дата начала обработки статистических данных - 27 января 2016 г.

Publisher:

Institute Officers:

Contact us: