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Characteristics of YBCO|CeO2|Al2O3 structures with decreasing thickness of the cerium oxide sublayer
Boryakov A. V.1, Masterov D. V.
1, Pavlov S. A.1, Parafin A. E.
1, Yunin P. A.
1
1Federal Research Center A.V. Gaponov-Grekhov Institute of Applied Physics of the Russian Academy of Sciences, Nizhny Novgorod, Russia
Email: boryakov@phys.unn.ru, masterov@ipmras.ru, pavlov@ipmras.ru, parafin@ipmras.ru, yunin@ipmras.ru
The transport properties, surface morphology and structure of epitaxial Y1Ba2Cu3O7-x (YBCO) films have been studied with decreasing thickness of the CeO2 epitaxial buffer layer on sapphire. It has been shown that the critical temperature and critical current density of YBCO films retain high values (Tc>87 K, Jc(77 K)>2 MA/cm2) as the thickness of the CeO2 sublayer decreases from 100 nm to 1.2 nm. YBCO films remain superconducting on a CeO2 layer with an equivalent thickness of 0.1 nm. The study was carried out with financial support of Russian Science Foundation as a part of scientific project no. 24-29-00824. The equipment of the Center for Collective Use of Institute for Physics of Microstructures of Russian Academy of Sciences "Physics and Technology of Micro- and Nanostructures" was used. Keywords: nano- and microstructures, formation of the topology of microstructure, growth in local areas, HTSC.
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