Technical Physics
To authors
The thermal image receiver realized in the Image intensifier tube architecture
Grevcev A. S.1, Zolotukhin P. A.1, Il'ichev E. A.1, Petruhin G. N.1, Popov A. V.
1, Rychkov G. S. 1
1 National Research University of Electronic Technology - MIET, Zelenograd, Moscow, Russia
Email: den.lorndern@gmail.com, pasher2086@yandex.ru, edil44@mail.ru, georg.petruhin@gmail.com, mstlena2@mail.ru
An innovative design of thermal imaging is considered. The results of analysis and calculations of the characteristics of a thermal image receiver (3-15 μm), made in the electron-optical converter architecture, are presented. The spatial dependences of the spontaneous polarization the electric field strengths and the electric potentials on the surface of pyroelectric film are calculated. The characteristics of thermal-field-induced polarization of various pyroelectric films are obtained. The temperature dependences of various pyroelectric films polarizations are calculated by the COMSOL Multiphysics software package based on the finite element method. The possible influences of the piezoelectric effect to the images of the distribution of electric potentials of pyroelectric films are taken into account. The estimates of the values of the main characteristics of the image intensifier tube architecture are obtained. Keywords: the image intensifier tube, spontaneous polarization, pyroelectric, bolometric thermal imagers, pyroelectric thermal imagers.
- C. Jelen, S.B. Slivken, T. David, G. Brown, M. Razeghi. In: Photodetectors: Materials and Devices III, ed. by G.J. Brown (San Jose, Proc. SPIE, 1998), v. 3287, p. 96--104. DOI: 10.1117/12.304470
- O.O. Cellek, S. Ozer, C. Besikci. IEEE J. Quant. Electron., 41 (7), 980 (2005). DOI: 10.1109/JQE.2005.848947
- S.U. Eker, Y. Arslan, C. Besikci. Infrared Phys. Technol., 54 (2), 209 (2011). DOI: 10.1016/j.infrared.2010.12.015
- L.T. Chee, M. Hooman. Nanophotonics, 7 (1), 1 (2017). DOI: 10.1515/nanoph-2017-0061
- V.V. Korotaev, G.S. Mel'nikov, S.V. Mikheev, V.M. Samkov, Yu.I. Soldatov. Osnovy teplovideniya (St. Petersburg: NIU ITMO, St. Petersburg, 2012), p. 122 (in Russian)
- J.E. Huffman, A.G. Crouse, B.L. Halleck, T.V. Downes. J. Appl. Phys., 72 (1), 273 (1998). DOI: 10.1063/1.352127
- N. Sclar. In: Infrared Detectors, ed. by W.L. Wolfe (San-Diego, Proc. SPIE, 1983), v. 0443, p. 11--41. DOI: 10.1117/12.937937
- S.M. Birkmann, J. Stegmaier, U. Grozinger, O. Krause. In: High Energy, Optical, and Infrared Detectors for Astronomy III, ed. by D.A. Dorn, A.D. Holland (Marceille, Proc, SPIE, 2008), v. 7021, p. 70210R. DOI: 10.1117/12.789103
- S.I. Woods, J.E. Proctor, T.M. Jung, A.C. Carter, J. Neira, D.R. Defibaugh. Appl. Opt., 57 (18), D82 (2018). DOI: 10.1364/AO.57.000D82
- A. Rogalski. Infrared Phys. Technol., 43 (3--5), 187 (2002). DOI: 10.1016/S1350-4495(02)00140-8
- G. Eppeldauer, M. Racz. Appl. Opt., 39 (31), 5739 (2000). DOI: 10.1364/AO.39.005739
- H. Yuan, G. Apgar, J. Kim, J. Laquindanum, V. Nalavade. Infrared Technology and Applications XXXIV, ed. by B.F. Andersen, G.F. Fulop, P.R. Norton (Orlando, Proc. SPIE, 2008), v. 6940, p. 69403C. DOI: 10.1117/12.782735
- A. Rogalski. Infrared Phys. Technol., 54 (5), 126 (2011). DOI: 10.1016/j.infrared.2010.12.003
- I.E. Carranza, J. Grant, J. Gough, R.S. David. IEEE Trans. Terahertz Sci. Technol., 5 (6), 892 (2015). DOI: 10.1109/TTHZ.2015.2463673
- Y.-Z. Deng, S.-F. Tang, H.-Y. Zeng, Z.-Y. Wu, D.-K. Tung. Sensors (Basel), 18 (2593), 1 (2018). DOI: 10.3390/s18082593
- M.F. Rashman, I.A. Steele, S.D. Bates, D. Copley, S.N. Longmore. Monthly Notices Royal Astronom. Society, 492 (1), 480 (2020). DOI: 10.1093/mnras/stz3497
- C. Vedel, J.-L. Martin, J.-L. Ouvrier Buffet. In: Infrared Technology and Applications XXV, ed. by B.F. Andersen, M. Strojnik (Orlando, Proc. SPIE, 1999), v. 3698, p. 276--283. DOI: 10.1117/12.354529
- T. Schimert, D. Ratcliff, J. Brady, S. Ropson, R. Gooch, B. Ritchey, P. McCardel, K. Rachels, M. Wand, M. Weinstein, J. Wyim. In: Unattended Ground Sensor Technologies and Applications, ed. by E.M. Carapezza, D.B. Law, K.T. Stalker (Orlando, Proc. SPIE, 1999), v. 3713, p. 101--111. DOI: 10.1117/12.357125
- S. Estill, M.R. Brozel. MRS Online Proceed. Library, 299, 27 (1994). DOI: 10.1557/PROC-299-27
- C. Hoffman, R. Driggers. Encyclopedia of Optical and Photonic Engineering (Print) --- Five Volume Set (CRC Press, Florida, 2015), p. 4088. ISBN: 9781439850978
- F.J. Low. J. Optical Society America, 51 (11), 1300 (1961). DOI: 10.1364/JOSA.51.001300
- M.A. Tarasov, L.S. Kuzmin, V.S. Edelman, N.S. Kaurova, M.Yu. Fominskii, A.B. Ermakov. JETP Lett., 92, 416 (2010). DOI: 10.1134/S0021364010180116
- A. Rogalski. Infrared Detectors: 2nd ed. (CRC Press, Florida, 2020), p. 898. ISBN: 9780367577094
- S.K. Holland, R.H. Krauss, G. Laufer. Optical Engineer., 43 (10), 2303 (2004). DOI: 10.1117/1.1782612
- C.B. Roundy, R.L. Byer. J. Appl. Phys., 44 (2), 929 (1973). DOI: 10.1063/1.1662294
- M.C. Kao, H.Z. Chen, S.L. Yang, Y.C. Chen, P.T. Hsieh, C.C. Yu. Thin. Solid Films, 516 (16), 5518 (2008). DOI: 10.1016/j.tsf.2007.07.020
- C. Giebeler, J. Wright, S. Freeborn, N. Conway, T. Chamberlain, P. Clark, M. Schreiter, D. Pitzer, R. Koehle. SENSOR + TEST Conference 2009 (Nurnberg, AMA Service GmbH, 2009), p. 185--189. DOI: 10.5162/irs09/i1.1
- C.M. Dudhe, S.B. Nagdeote, C. P. Chaudhari. Taylor \& Francis, Ferroelectrics, 482, 104 (2015). DOI: 10.1080/00150193.2015.1057080
- W.R. Cook, jr. Piezoelectric, Pyroelectric, and Related Constants (Springer-Verlag, Berlin, Heidelberg, Berlin, 1994), p. 543. ISBN: 978-3-540-55065-5
- S.T. Liu, R.B. Maciolek. J. Electron. Mater., 4 (1), 91 (1975). DOI: 10.1007/BF02657838
- H.V. Alexandru, C. Berbecaru, F. Stanculescu, L. Pintilie, I. Matei, M. Lisca. Sensors Actuators A: Phys., 113 (3), 387 (2004). DOI: 10.1016/j.sna.2004.03.046
- W.A. Tiller. The Science of Crystallization Macroscopic Phenomena and Defect Generation (Cambridge University Press, California, 1992), p. 520. ISBN: 9780521388283
- S. Yarlagadda, H.W. Chan, H. Lee. J. Intelligent Mater. Systems Structures, 6 (6), 757 (1995). DOI: 10.1177/1045389X9500600603
- J. Ouyang. Enhanced Piezoelectric Performance of Printed PZT Films on Low Temperature Substrates (Rochester, Rochester Institute of Technology, 2017)
- T.A. Germer, J.C. Zwinkels, B.K. Tsai. Spectrophotometry: Accurate Measurement of Optical Properties of Materials (Amsterdam, Academic Press, 2014), v. 46, p. 533. ISBN: 9780123860224
- W.R. Cook, jr. Piezoelectric, Pyroelectric, and Related Constants (Springer-Verlag, Berlin, Heidelberg, Berlin, 1994), p. 543. ISBN: 978-3-540-55065-5
- L. Zhang, R. Barrett, P. Cloetens, C. Detlefs, M. Sanchez del Rio. J. Synchrotron Rad., 21, 507 (2014). DOI: 10.1107/S1600577514004962
- Y. Wu, G. Caoa. J. Mater. Res., 15 (7), 1583 (2000). DOI: 10.1557/JMR.2000.0227
- M. Vollmer, K.-P. Mollmann. Infrared Thermal Imaging Fundamentals, Research and Applications (Wiley-VCH, 2018), p. 794. ISBN: 978-3-527-41351-5
Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.
Дата начала обработки статистических данных - 27 января 2016 г.
