Optics and Spectroscopy
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Study of plasmon resonance in Bi2Se3 and Sb2Te3 by infrared spectral ellipsometry
In the infrared region of the spectrum (IR), the optical properties of single-crystal samples of narrow-gap degenerate semiconductors Bi2Se3 and Sb2Te3 are investigated by infrared spectral ellipsometry (SE). The transport properties of the Drude fitting of dielectric functions obtained by spectroscopic ellipsometry are studied. The behavior of the bulk and surface plasmon polaritons is investigated in detail. The dispersion and mean free path of the plasmon, the depth of the skin layer for the conducting and dielectric surfaces are calculated. The contribution of the plasmon to the optical properties is estimated from the spectral density for the Bi2Se3 and Sb2Te3 samples. Keywords: ellipsometry, plasmon, plasmonics, plasmon dispersion, plasmon mean free path, plasmon penetration depth.
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