Technical Physics
To authors
Volumes and Issues
- 2024
- 2023
- 2022
Changes in the characteristics of semiconductor structures of microwave amplifiers under the action of pulsed laser radiation
The effect of pulsed laser radiation on the change in the parameters of semiconductor structures of field-effect transistors with a Schottky gate with an operating frequency range of 1.5-8 GHz and integrated amplifiers with an operating frequency range of 0.4-6 GHz is studied. Laser radiation with 25 ns pulse duration, incident on the transistor crystal, creates a pulsed photocurrent. It is shown that the amplitude of the pulsed photocurrent is three times higher than the operating transistor current. The current-voltage characteristics of the field-effect transistor were measured in the mode of pulsed laser radiation. The amplitude dependence of the pulsed photocurrent in semiconductor structures on the power of laser radiation for various wavelengths of 1.06 μm and 0.53 μm is studied. It is shown that as a result of the action of pulsed laser radiation on semiconductor structures, a short disappearance of the amplification of the high-frequency signal at the amplifier output occurs. Keywords: laser radiation, transistor, microwave amplifier, photocurrent, current-voltage characteristic.
- A.I. Belous, V.A. Solodukha, S.V. Shvedov. Kosmicheskaya elektronika (Tekhnosfera, M., 2015) (in Russian)
- U. Scheuermann, U. Schilling. IET Power Electron., 9 (10), 2027 (2016). DOI: 10.1049/iet-pel.2015.1003
- B.D. Weaver, D. McMorrow, L.M. Cohn. Int. J. High Speed Electron. Syst., 13, 293 (2003). DOI: 10.1142/S0129156403001624
- H.J. Barnaby. IEEE Tr. Nucl. Sci., 53 (6), 3103 (2006)
- E.A. Tarasova, S.V. Obolensky, S.V. Khazanova, N.N. Grigoryeva, O.L. Golikov, A.B. Ivanov, A.S. Puzanov. Semiconductors, 54 (9), 1155 (2020). DOI: 10.1134/S1063782620090274
- V.G. Mokerov, A.A. Kuznetsov, Y.V. Fedorov, Y.N. Yenyushkina, A.S. Bugayev, A.Y. Pavlov, D.L. Gnatyuk, A.V. Zuyev, R.R. Galiyev, Y.N. Ovcharenko, Y.N. Sveshnikov, A.F. Tsatsulnikov, V.M. Ustinov. FTP., 43 (4), 561 (2009) (in Russian)
- D.V. Gromov, P.P. Maltsev, S.A. Polevich. Semiconductors, 50 (2), 222 (2016). DOI: 10.1134/S1063782616020093
- V.V. Elesin. Russ. Microelectron., 43 (2), 139 (2014). DOI: 10.1134/S106373971402005X
- P.K. Skorobogatov, A.Yu. Nikiforov, A.N. Egorov. Russ. Microelectron., 44 (1), 8 (2015). DOI: 10.1134/S1063739715010084
Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.
Дата начала обработки статистических данных - 27 января 2016 г.