Technical Physics Letters
To authors
Magnetic Properties of magnetron sputtered La0.7Sr0.3MnO3 thin films
Shaikhulov T. A.1, Stankevich K. L.2, Luzanov V. A.1, Zhivulin V. E. 3, Vinnik D. A. 3, Safin A. R.1,4, Kalyabin D. V. 1,5, Kozlova E. E.1,5, Nikitov S. A. 1,5,6
1Kotelnikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences, Moscow, Russia
2Lomonosov Moscow State University, Moscow, Russia
3South Ural State University (National Research University), Chelyabinsk, Russia
4National Research University «Moscow Power Engineering Institute», Moscow, Russia
5Moscow Institute of Physics and Technology (National Research University), Dolgoprudny, Moscow Region, Russia
6Saratov State University, Saratov, Russia
2Lomonosov Moscow State University, Moscow, Russia
3South Ural State University (National Research University), Chelyabinsk, Russia
4National Research University «Moscow Power Engineering Institute», Moscow, Russia
5Moscow Institute of Physics and Technology (National Research University), Dolgoprudny, Moscow Region, Russia
6Saratov State University, Saratov, Russia
Email: shcaihulov@hitech.cplire.ru
The results of studying the influence of the thickness of La0.7Sr0.3MnO3 films obtained by magnetron sputtering on (110) NdGaO3 substrates on the magnetic and crystallographic properties using ferromagnetic resonance and X-ray spectroscopy are presented. The dependences of the uniaxial and cubic anisotropy fields on the sample thickness are established. Furthermore, it is shown that the magnetic and crystallographic properties of a film obtained by magnetron sputtering strongly depend on the target region from which it is made. The results obtained will be useful for interpreting the experimental data and creating a series of samples. Keywords: ferromagnet, magnetic anisotropy, ferromagnetic resonance. DOI: 10.61011/TPL.2023.06.56381.19545
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