Technical Physics
To authors
On the correct use of refractive lenses for microscopy with high spatial resolution at fourth-generation synchrotron radiation facilities
Khomyakov Yu. V.
1, Rakshun Ya. V.
1,2, Chernov V. A.1
1Budker Institute of Nuclear Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia
2Siberian State University of Telecommunications and Information Science, Novosibirsk, Russia
2Siberian State University of Telecommunications and Information Science, Novosibirsk, Russia
Email: yu.v.khomyakov@yandex.ru, ya.v.rakshun@inp.nsk.su, v.a.chernov@mail.ru
The concept of an undulator-based beamline for refractive lenses-based hard X-ray coherent nanoscopy and nanotomography at a fourth-generation synchrotron radiation source is presented. We describe experimental scenarios and optics operational modes that allow varying the scale of the sample area under study in the range of ~0.1-100 μm and achieving spatial resolution down to ~10 nm. Solutions to eliminate the disadvantages of beryllium lenses are proposed. Keywords: X-ray microscopy, coherent imaging, synchrotron radiation, X-ray refractive optics.
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