Field electron emission from a carbon nanotube amino acid composite layer
Tsybin O. Yu. 1, Baranov M. A. 1, Popov M. E. 1,2, Filippov S. V. 2, Kolosko A. G. 2, Popov E. O. 2
1Peter the Great Saint-Petersburg Polytechnic University, St. Petersburg, Russia
2Ioffe Institute, St. Petersburg, Russia
Email: oleg.tsybin@gmail.com, baranovma1993@gmail.com, popov_me@spbstu.ru, f_s_v@list.ru, agkolosko@mail.ru, e.popov@mail.ioffe.ru

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The paper presents a study of the field emission properties of a new nanocomposite material based on a mixture of carbon nanotubes and organic substance (valine amino acid). On the surface of a thin composite layer covering an electrically conductive metal cathode there was experimentally revealed a developed network of active electron emission sites. Valine not only enhanced field emission properties of the composite surface, but also acted as a binder thus providing high adhesion and strength of the nanocomposite coating. Keywords: electron field emission, carbon nanotubes, amino acid, valine.
  1. J. Wang, Electroanalysis, 17(1), 7 (2005). DOI: 10.1002/elan.200403113
  2. J.R. Siqueira, L. Caseli, F.N. Crespilho, V. Zucolotto, O.N. Oliveira, Biosens. Bioelectron., 25 (6), 1254 (2010). DOI: 10.1016/j.bios.2009.09.043
  3. W. Putzbach, N.J. Ronkainen, Sensors, 13 (4), 4811 (2013). DOI: 10.3390/s130404811
  4. L. Ma, H.L. Zhuang, S. Wei, K.E. Hendrickson, M.S. Kim, G. Cohn, R.G. Hennig, L.A. Archer, ACS Nano, 10 (1), 1050 (2016). DOI: 10.1021/acsnano.5b06373
  5. R. Yadav, K. Kumar, P. Venkatesu, in Handbook of carbon nanotubes, ed. by J. Abraham, S. Thomas, N. Kalarikkal (Springer, Cham, 2021). DOI: 10.1007/978-3-319-70614-6_65-1
  6. R.G. Forbes, Solid-State Electron., 45 (6), 779 (2001). DOI: 10.1016/S0038-1101(00)00208-2
  7. H.M. Oh, J.H. Ryu, N.Y. Bae, E.H. Lee, A.N. Ha, W.M. Bae, J. Jang, K.C. Park, in Int. Vacuum Nanoelectronics Conf. (IEEE, 2010), p. 127--128. DOI: 10.1109/IVNC.2010.5563137
  8. S. Srividya, S. Gautam, P. Jha, P. Kumar, A. Kumar, U.S. Ojha, J.S.B.S. Rawat, S. Pal, P.K. Chaudhary, Harsh, R.K. Sinha, Appl. Surf. Sci., 256 (11), 3563 (2010). DOI: 10.1016/j.apsusc.2009.12.155
  9. A. Kumar, V.L. Pushparaj, S. Kar, O. Nalamasu, P.M. Ajayan, R. Baskaran, Appl. Phys. Lett., 89 (16), 163120 (2006). DOI: 10.1063/1.2356899
  10. Y.J. Jung, S. Kar, S. Talapatra, C. Soldano, G. Viswanathan, X. Li, Z. Yao, F.S. Ou, A. Avadhanula, R. Vajtai, S. Curran, O. Nalamasu, P.M. Ajayan, Nano Lett., 6 (3), 413 (2006). DOI: 10.1021/nl052238x
  11. H. Jung, S.Y. An, D.M. Jang, J.M. Kim, J.Y. Park, D. Kim, Carbon, 50 (3), 987 (2012). DOI: 10.1016/j.carbon.2011.10.001
  12. L.T. Cheng, M. Zheng, W. Mahler, D. Roach, A. Fennimore, G. Reynolds, I.H. Kim, C.S. Lee, H.S. Kim, SID Symp. Digest Tech. Papers, 39 (1), 155 (2008). DOI: 10.1889/1.3069457
  13. P. Wilhite, A.A. Vyas, J. Tan, J. Tan, T. Yamada, P. Wang, J. Park, C.Y. Yang, Semicond. Sci. Technol., 29 (5), 054006 (2014). DOI: 10.1088/0268-1242/29/5/054006
  14. F. Banhart, Nanoscale, 1 (2), 201 (2009). DOI: 10.1039/B9NR00127A
  15. S.Y. Yew, G. Shekhawat, N. Wangoo, S. Mhaisalkar, C.R. Suri, V.P. Dravid, Y.M. Lam, C.R. Suri, V.P. Dravid, Y.M. Lam, Nanotechnology, 22 (21), 215606 (2011). DOI: 10.1088/0957-4484/22/21/215606
  16. I. Ron, L. Sepunaru, S. Itzhakov, T. Belenkova, N. Friedman, I. Pecht, M. Sheves, D. Cahen, J. Am. Chem. Soc., 132 (12), 4131 (2010). DOI: 10.1021/ja907328r
  17. E.O. Popov, A.G. Kolosko, S.V. Filippov, E.I. Terukov, R.M. Ryazanov, E.P. Kitsyuk, J. Vac. Sci. Technol. B, 38 (4), 043203 (2020). DOI: 10.1116/6.0000072
  18. A.G. Kolosko, E.O. Popov, S.V. Filippov, Y. Gotoh, J. Vac. Sci. Technol. B, 37 (3), 031803 (2019). DOI: 10.1116/1.5090461
  19. A.G. Kolosko, S.V. Filippov, P.A. Romanov, E.O. Popov, R.G. Forbes, J. Vac. Sci. Technol. B, 34 (4), 041802 (2016). DOI: 10.1116/1.4946834
  20. V. Barone, J.E. Peralta, J. Uddin, G.E. Scuseria, J. Chem. Phys., 124 (2), 024709 (2006). DOI: 10.1063/1.2150213
  21. A.N. Zavilopulo, A.I. Bulhakova, S.S. Demes, E.Yu. Remeta, A.V. Vasiliev, Eur. Phys. J. D, 75, 287 (2021). DOI: 10.1140/epjd/s10053-021-00294-2

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