Technical Physics Letters
Volumes and Issues
Home » Technical Physics Letters » Year 2025, issue 9 » Article p. 23
<<<>>>
Multi-frequency generation in Josephson junction arrays
Russian version
Galin M. A. 1, Revin L. S. 1,2, Levichev M. Yu. 1, Parafin A. E. 1, Masterov D. V. 1, Kurin V. V. 1, Shereshevsky I. A. 1, Vdovicheva N. K. 1
1Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhny Novgorod, Russia
2Alekseev State Technical University, Nizhny Novgorod, Russia
Email: galin@ipmras.ru, rls@ipmras.ru, levichev@ipmras.ru, parafin@ipmras.ru, masterov@ipmras.ru, kurin@ipmras.ru, ilya@ipmras.ru, hope@ipmras.ru
PDF
The phenomenon of multi-frequency generation was revealed in experimental study of electromagnetic radiation spectra of a large low-temperature Josephson junction array fabricated on the basis of niobium. The array spectrum was measured by a superconducting receiver with a high-temperature bicrystal Josephson junction. Numerical simulation of Josephson system similar to that studied experimentally showed that the multi-frequency generation regime occurs when the junction array contains eigenmodes with close frequencies. Keywords: Josephson junction array, bicrystal Josephson junction, spectroscopy, FDTD method, resonator.
  1. I.K. Yanson, V.M. Svistunov, I.M. Dmitrenko, JETP, 21 (3), 650 (1965)
  2. M. Darula, T. Doderer, S. Beuven, Supercond. Sci. Technol., 12 (1), R1 (1999). DOI: 10.1088/0953-2048/12/1/001
  3. A.K. Jain, K.K. Likharev, J.E. Lukens, J.E. Sauvageau, Phys. Rep., 109, 309 (1984). DOI: 10.1016/0370-1573(84)90002-4
  4. O. Kieler, R. Wendisch, R.-W. Gerdau, T. Weimann, J. Kohlmann, R. Behr, IEEE Trans. Appl. Supercond., 31 (5), 1100705 (2021). DOI: 10.1109/TASC.2021.3060678
  5. S. Bauer, R. Behr, J. Herick, O. Kieler, M. Kraus, H. Tian, Y. Pimsut, L. Palafox, Meas. Sci. Technol., 34 (3), 032001 (2023). DOI: 10.1088/1361-6501/aca5a5
  6. S.K.H. Lam, J. Lazar, J. Du, C.P. Foley, Supercond. Sci. Technol., 27 (5), 055011 (2014). DOI: 10.1088/0953-2048/27/5/055011
  7. K.-H. Muller, E.E. Mitchell, Phys. Rev. B, 109 (5), 054057 (2024). DOI: 10.1103/PhysRevB.109.054507
  8. D. Oikawa, H. Mitarai, H. Tanaka, K. Tsuzuki, Y. Kumagai, T. Sugiura, H. Andoh, T. Tsukamoto, Appl. Phys. Lett., 10 (8), 085113 (2020). DOI: 10.1063/5.0018989
  9. M.M. Krasnov, N.D. Novikova, R. Cattaneo, A.A. Kalenyuk, V.M. Krasnov, Beilstein J. Nanotechnol., 12, 1392 (2021). DOI: 10.3762/bjnano.12.103
  10. V.P. Koshelets, M. Birk, D. Boersma, J. Dercksen, P.N. Dmitriev, M.I. Faley, L.V. Filippenko, K.V. Kalashnikov, N.V. Kinev, O.S. Kiselev, A.A. Artanov, K.I. Rudakov, A. de Lange, G. de Lange, V.L. Vaks, M.Y. Li, H. Wang, IEEE Trans. Appl. Supercond., 5 (4), 687 (2015). DOI: 10.1109/tthz.2015.2443500
  11. M.A. Galin, A.M. Klushin, V.V. Kurin, S.V. Seliverstov, M.I. Finkel, G.N. Goltsman, F. Muller, T. Scheller, A.D. Semenov, Supercond. Sci. Technol., 28 (5), 055002 (2015). DOI: 10.1088/0953-2048/28/5/055002
  12. F. Mueller, R. Behr, T. Weimann, L. Palafox, D. Olaya, P.D. Dresselhaus, S.P. Benz, IEEE Trans. Appl. Supercond., 19 (3), 981 (2009). DOI: 10.1109/TASC.2009.2017911
  13. M.A. Galin, E.A. Borodianskyi, V.V. Kurin, I.A. Shereshevsky, N.K. Vdovicheva, V.M. Krasnov, A.M. Klushin, Phys. Rev. Appl., 9 (5), 054032 (2018). DOI: 10.1103/PhysRevApplied.9.054032
  14. M.A. Galin, F. Rudau, E.A. Borodianskyi, V.V. Kurin, D. Koelle, R. Kleiner, V.M. Krasnov, A.M. Klushin, Phys. Rev. Appl., 14 (1), 024051 (2020). DOI: 10.1103/PhysRevApplied.14.024051
  15. F. Song, F. Muller, R. Behr, A.M. Klushin, Appl. Phys. Lett., 95 (17), 172501 (2009). DOI: 10.1063/1.3253417
  16. M.A. Galin, L.S. Revin, A.V. Samartsev, M.Yu. Levichev, A.I. El'kina, D.V. Masterov, A.E. Parafin, Tech. Phys., 69 (7), 973 (2024). DOI: 10.61011/TP.2024.07.58800.166-24.
  17. M.A. Galin, I.A. Shereshevsky, N.K. Vdovicheva, V.V. Kurin, Supercond. Sci. Technol., 34 (7), 075005 (2021). DOI: 10.1088/1361-6668/abfd0b
  18. K.K. Likharev, Dynamics of Josephson Junctions and Circuits (Gordon and Breach Science Publishers, New York, NY, USA, 1986), pp. 45-47
  19. Y. Chen, L. Jiang, Q. Liu, IEEE Photon. Technol. Lett., 32 (16), 975 (2020). DOI: 10.1109/LPT.2020.3006881
  20. M. Varavin, A. Varavin, D. Naydenkova, J. Zajac, F. Zacek, S. Nanobashvili, R. Panek, V. Weinzettl, P. Bilkova, K. Kovarik, F. Jaulmes, M. Farnik, M. Imrisek, O. Bogar, Fusion Eng. Des., 146, 1858 (2019). DOI: 10.1016/j.fusengdes.2019.03.051
Publisher:

Ioffe Institute

Institute Officers:

Director: Sergei V. Ivanov

Contact us:

26 Polytekhnicheskaya, Saint Petersburg 194021, Russian Federation
Fax: +7 (812) 297 1017
Phone: +7 (812) 297 2245
E-mail: post@mail.ioffe.ru