Josephson tunnel junctions with integral SIN shunting.
Shevchenko M. S.1,2, Filippenko L. V.1, Kiselev O. S.1,3, Koshelets V. P.1,3
1Kotelnikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences, Moscow, Russia
2Center for Photonics and 2D Materials, Moscow Institute of Physics and Technology, Dolgoprudnyi, Russia
3Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhny Novgorod, Russia
Email: shevchenko@hitech.cplire.ru, lyudmila@hitech.cplire.ru, kiselev@hitech.cplire.ru, valery@hitech.cplire.ru
This work is devoted to the study of tunnel Josephson superconductor-insulator-superconductor (SIS) junctions with a new type of shunting based on the usage of an additional superconductor-insulator-normal metal (NIS) junction located around the SIS junction. Numerical calculations of the parameters of such shunted junctions were carried out and modeling of their IVC (current-voltage characteristics) was performed. The designed samples were manufactured, their parameters were studied. To investigate the behavior of junctions under the influence of high-frequency signals in the sub-THz range, their IVCs were measured. Keywords: Superconducting devices, superconductor-insulator-superconductor tunnel junction, Josephson effect, shunting of Josephson junctions.
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