Low frequency noise and resistance in non-passivated InAsSbP/InAs based photodiodes in the presence of atmosphere with ethanol vapor
Levinshtein M. E.1, Matveev B. A.1, Dyakonova N.2
1Ioffe Institute, St. Petersburg, Russia
2Laboratoire Charles Coulomb (L2C), University of Montpellier, Montpellier, France
Email: melev@nimis.ioffe.ru

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Low frequency noise and electrical characteristics of the p-InAsSbP/n-InAs single photodiode heterostructures grown onto n+-InAs substrates have been measured in the presence of atmosphere containing ethanol vapor. Correlation between ethanol vapor density and electrical noise spectral density, as well as the heterostructure resistance, has been estimated, and possible reasons for such correlation have been discussed. Keywords: InAs-photodiodes, hydrocarbon sensor, low-frequency noise, InAs natural surface oxide, surface-sensitive structures. DOI: 10.61011/TPL.2023.06.56371.19524
  1. V.I. Nikolaev, A.V. Almaev, B.O. Kushnarev, A.I. Pechnikov, S.I. Stepanov, A.V. Chikiryaka, R.B. Timashov, M.P. Scheglov, P.N. Butenko, E.V. Chernikov, Tech. Phys. Lett., 48 (7), 76 (2022). DOI: 10.21883/TPL.2022.07.54046.19211
  2. L.Yu. Fedorov, A.V. Ushakov, I.V. Karpov, Tech. Phys. Lett., 48 (7), 58 (2022). DOI: 10.21883/TPL.2022.07.54041.19197
  3. G. Scandurra, J. Smulko, L.B. Kish, Appl. Sci., 10 (17), 5818 (2020). DOI: 10.3390/app10175818
  4. Y.-C. Lee, P.-L. Yang, Ch.I. Chang, W. Fang, Proceedings, 2 (13), 772 (2018). DOI: 10.3390/proceedings2130772
  5. M.V. Lebedev, Semiconductors, 54 (7), 699 (2020). DOI: 10.1134/S1063782620070064
  6. V. Demontis, M. Rocci, M. Donarelli, R. Maiti, V. Zannier, F. Beltram, L. Sorba, S. Roddaro, F. Rossella, C. Baratto, Sensors, 19 (13), 2994 (2019). DOI: 10.3390/s19132994
  7. M.A. Kinch, State-of-the-art infrared detector technology (SPIE, Bellingham-Washington, 2014), p. 280
  8. X. Du, B.T. Marozas, G.R. Savich, G.W. Wicks, J. Appl. Phys., 123 (21), 214504 (2018). DOI: 10.1063/1.5027637
  9. A.V. Pentsov, S.V. Slobodchikov, N.M. Stus', G.M. Filaretova, Sposob polucheniya fotodiodov, avtorskoe svidetel'stvo 1840979, zayavka N 3207490/28 (prioritet ot 15.08.1988, opubl. 20.11.2014), byul. N 32. (in Russian)
  10. N. Dyakonova, S.A. Karandashev, M.E. Levinshtein, B.A. Matveev, M.A. Remennyi, Semicond. Sci. Technol., 33 (6), 065016 (2018). DOI: 10.1088/1361-6641/aac15d
  11. G.P. Forcade, Ch.E. Valdivia, S. Molesky, S. Lu, A.W. Rodriguez, J.J. Krich, R. St-Gelais, K. Hinzer, Appl. Phys. Lett., 121 (19), 193903 (2022). DOI: 10.1063/5.0116806
  12. H. Lin, Z. Zhou, H. Xie, Y. Sun, X. Chen, J. Hao, S. Hu, N. Dai, Phys. Status Solidi A, 218 (18), 2100281 (2021). DOI: 10.1002/pssa.202100281
  13. A. Tkachuk, V. Tetyorkin, A. Sukach, in 2021 Int. Semiconductor Conf. (CAS) (Romania, 2021), p. 279--282. DOI: 10.1109/CAS52836.2021.9604182
  14. B.A. Matveev, G.Yu. Sotnikova, Opt. Spectrosc., 127 (2), 322 (2019). DOI: 10.1134/S0030400X19080198.
  15. A.V. Zagnit'ko, I.D. Matsukov, V.V. Pimenov, S.E. Sal'nikov, D.Yu. Fedin, V.I. Alekseev, S.M. Vel'makin, Tech. Phys., 92 (6), 664 (2022). DOI: 10.21883/TP.2022.06.54410.325-21
  16. A. Tseng, D. Lynall, I. Savelyev, M. Blumin, S. Wang, H.E. Ruda, Sensors, 17 (7), 1640 (2017). DOI: 10.3390/s17071640

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