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The effect of interference in thin films on the optical characteristics of holograms recorded on As-Se layers
Russian version
Ganzherli N. M. 1
1Ioffe Institute, St. Petersburg, Russia
Email: nina.holo@mail.ioffe.ru
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The effect of interference in thin films on the optical characteristics of holograms recorded on the layers of a chalcogenide glassy semiconductor of the As-Se system has been evaluated. The changes in the magnitude of reflection, transmission and optical difference in the path of the rays during the action of actinic He-Ne laser radiation on the layers are measured. Keywords: interference in thin films, chalcogenide glassy semiconductors, refractive index, reflection, transmission, optical path difference, diffraction effectivity of holograms.
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