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Photoluminescence of Hg0.3Cd0.7Te and Hg0.7Cd0.3Te epitaxial films
Russian version
Ruzhevich M. S.1, Mynbaev K. D. 1,2, Bazhenov N. L. 2, Varavin V. S. 3, Remesnik V. G. 3, Mikhailov N. N. 3, Yakushev M. V. 3
1ITMO University, St. Petersburg, Russia
2Ioffe Institute, St. Petersburg, Russia
3Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia
Email: max.ruzhevich@niuitmo.ru, mynkad@mail.ioffe.ru, bazhnil.ivom@mail.ioffe.ru, varavin@isp.nsc.ru, remesnik@isp.nsc.ru, mikhailov@isp.nsc.ru, yakushev@isp.nsc.ru
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The results of a study of photoluminescence (PL) of epitaxial films of Hg0.3Cd0.7Te and Hg0.7Cd0.3Te solid solutions grown by molecular beam epitaxy are presented. A comparison of PL data with the results of optical transmission measurements and structural and microscopic studies showed that in terms of the degree of disorder of the solid solution, the studied Hg0.7Cd0.3Te films are not inferior in quality to the material synthesized by other methods. For Hg0.3Cd0.7Te films, PL data revealed significant composition fluctuations and the presence of acceptor states, which indicates the need to optimize the technology Keywords: solid solutions, HgCdTe, photoluminescence, defects.
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