Volumes and Issues
Home » Technical Physics » Year 2024, issue 8 » Article p. 1271
<<<>>>
Registration of pulsed terahertz radiation with uncooled matrix microbolometric detectors
Russian version
Dem’yanenko M. A. 1, Marchishin I. V. 1, Sheglov D. V. 1, Startsev V. V. 2
1Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia
2Joint-Stock Company “Scientific and Production Association “Orion” (JSC “SPA “Orion”), Moscow, Russia
Email: demyanenko@isp.nsc.ru
PDF
The response of uncooled matrix microbolometric detectors with a thin metal absorber to pulsed terahertz radiation is studied depending on the pulse duration, its repetition frequency, thermal conductivity and bolometer thermal relaxation time, which change with increasing gas pressure in the receiver housing, as well as on the polarization of terahertz radiation. It is shown that the peak value of the microbolometer signal weakly depends on thermal conductivity if the duration of the radiation pulses is less than the bolometer thermal relaxation time. Under the opposite condition, the peak value of the microbolometer signal is inversely proportional to the thermal conductivity value. The manufactured and investigated detectors at a wavelength of 100 μm are characterized by a minimum detectable power of 1.4·10-9 W and a minimum detectable energy of 2.5·10-11 J. Keywords: Thermal conductivity, thermal relaxation time, minimum detectable energy.
  1. A. Rogalski. Progr. Quant. Electron., 27 (2-3), 59 (2003). DOI: 10.1016/S0079-6727(02)00024-1
  2. A. Rogalski. Progr. Quant. Electron., 36 (2-3), 342 (2012). DOI: 10.1016/j.pquantelec.2012.07.001
  3. A. Rogalski. Opto--Electron. Rev., 21 (4), 406 (2013). DOI: 10.2478/s11772-013-0110-x
  4. A.W.M. Lee, B.S. Williams, S. Kumar, Q. Hu, J.L. Reno. IEEE Photon. Technol. Lett., 18 (13), 1415 (2006). DOI: 10.1109/LPT.2006.877220
  5. N. Oda. C.R. Physiq., 11 (7-8), 496 (2010). DOI: 10.1016/j.crhy.2010.05.001
  6. M.A. Dem'yanenko, D.G. Esaev, B.A. Knyazev, G.N. Kulipanov, N.A. Vinokurov. Appl. Phys. Lett., 92 (13), 131116 (2008). DOI: 10.1063/1.2898138
  7. N. Nemoto, N. Kanda, R. Imai, K. Konishi, M. Miyoshi, S. Kurashina, T. Sasaki, N. Oda, M. Kuwata-Gonokami. IEEE Trans. Terahertz Sci. Technol., 6 (2), 175 (2016). DOI: 10.1109/TTHZ.2015.2508010
  8. F. Simoens, J. Meilhan. Philosophical Transactions Royal Society of London A: Mathematical, Physical and Engineering Sciences, 372 (2012), 20130111 (2014). DOI: 10.1098/rsta.2013.0111
  9. F. Simoens, J. Meilhan, J.-A. Nicolas. J. Infrared Milli Terahz Waves, 36 (10), 961 (2015). DOI: 10.1007/s10762-015-0197-x
  10. Y. Amarasinghe, W. Zhang, R. Zhang, D.M. Mittleman, J. Ma. J. Infrared, Millimeter, Terahertz Waves, 41 (2), 215 (2020). DOI: 10.1007/s10762-019-00647-4
  11. Y. Yang, A. Shutler, D. Grischkowsky. Opt. Express, 19 (9), 8830 (2011). DOI: 10.1364/OE.19.008830
  12. G.S. Kent, B.R. Clemesha, R.W. Wright. J. Atmospheric Terrestrial Phys., 29 (2), 169 (1967). DOI: 10.1016/0021-9169(67)90131-6
  13. G.S. Kent, R.W. Wright. J. Atmospheric Terrestrial Phys., 32 (5), 917 (1970). DOI: 10.1016/0021-9169(70)90036-X
  14. G.-R. Kim, T.-I. Jeon, D. Grischkowsky. Opt. Express, 25 (21), 25422 (2017). DOI: 10.1364/OE.25.025422
  15. Y. Yang, M. Mandehgar, D. Grischkowsky. Opt. Express, 20 (24), 26208 (2012). DOI: 10.1364/OE.20.026208
  16. J.M. Dai, X.F. Lu, J. Liu, I.C. Ho, N. Karpowicz, X.-C. Zhang. Terahertz Sci. Technol., 2 (4), 131 (2009). DOI: 10.11906/TST.131-143.2009.12.14
  17. L.-Z. Tang, J.-Y. Zhao, Z.-H. Dong, Z.-H. Liu, W.-T. Xiong, Y.-C. Hui, A. Shkurinov, Y. Peng, Y.-M. Zhu. Opt. Laser Technol., 141, 107102 (2021). DOI: 10.1016/j.optlastec.2021.107102
  18. G.-R. Kim, K. Moon, K.H. Park, J.F. O'Hara, D. Grischkowsky, T.-I. Jeon. Opt. Express, 27 (20), 27514 (2019). DOI: 10.1364/OE.27.027514
  19. D.S. Sitnikov, S.A. Romashevskiy, A.A. Pronkin, I.V. Ilina. J. Physics: Conf. Ser., 1147, 012061 (2019). DOI: 10.1088/1742-6596/1147/1/012061
  20. V.L. Granatsteina, G.S. Nusinovich. J. Appl. Phys., 108 (6), 063304 (2010). DOI: 10.1063/1.3484044
  21. G.S. Nusinovich, D.G. Kashyn, Y. Tatematsu, T. Idehara. Phys. Plasmas, 21 (1), 013108 (2014). DOI: 10.1063/1.4862779
  22. C.W. Berry, M.R. Hashemi, M. Jarrahi. Appl. Phys. Lett., 104 (8), 081122 (2014). DOI: 10.1063/1.4866807
  23. D.S. Kim, D.S. Citrin. Appl. Phys. Lett., 88 (16), 161117 (2006). DOI: 10.1063/1.2196480
  24. H. Hirori, A. Doi, F. Blanchard, K. Tanaka. Appl. Phys. Lett., 98 (8), 091106 (2011). DOI: 10.1063/1.3560062
  25. M.A. Belkin, F. Capasso. Phys. Scripta, 90 (11), 118002 (2015). DOI: 10.1088/0031-8949/90/11/118002
  26. L. Li, L. Chen, J. Zhu, J. Freeman, P. Dean, A. Valavanis, A.G. Davies, E.H. Linfield. Electron. Lett., 50 (4), 309 (2014). DOI: 10.1049/el.2013.4035
  27. Q. Lu, M. Razeghi. Photonics, 3 (3), 42 (2016). DOI: 10.3390/photonics3030042
  28. G. Liao, Y. Li, H. Liu, G.G. Scott, D. Neely, Y. Zhang, B. Zhu, Z. Zhang, C. Armstrong, E. Zemaityte, P. Bradford, P.G. Huggard, D.R. Rusby, P. McKenna, C.M. Brenner, N.C. Woolsey, W. Wang, Z. Sheng, J. Zhang. Proc. National. Acad. Sci. USA, 116 (10), 3994 (2019). DOI: 10.1073/pnas.1815256116
  29. X. Wu, D. Kong, S. Hao, Y. Zeng, X. Yu, B. Zhang, M. Dai, S. Liu, J. Wang, Z. Ren, S. Chen, J. Sang, K. Wang, D. Zhang, Z. Liu, J. Gui, X. Yang, Y. Xu, Y. Leng, Y. Li, L. Song, Y. Tian, R. Li. Adv. Mater., 35 (23), 2208947 (2023). DOI: 10.1002/adma.202208947
  30. B. Zhang, Z. Ma, J. Ma, X. Wu, C. Ouyang, D. Kong, T. Hong, X. Wang, P. Yang, L. Chen, Y. Li, J. Zhang. Laser Photon. Rev., 15 (3), 2000295 (2021). DOI: 10.1002/lpor.202000295
  31. Z. Yu, N. Zhang, J. Wang, Z. Dai, C. Gong, L. Lin, L. Guo, W. Liu. Opto-Electron. Adv., 5 (9), 210065 (2022). DOI: 10.29026/oea.2022.210065
  32. V.L. Bratman, A.A. Bogdashov, G.G. Denisov, M.Yu. Glyavin, Yu.K. Kalynov, A.G. Luchinin, V.N. Manuilov, V.E. Zapevalov, N.A. Zavolsky, V.G. Zorin. J. Infrared Milli Terahz Waves, 33 (7), 715 (2012). DOI: 10.1007/s10762-012-9898-6
  33. G.S. Nusinovich, R. Pu, T.M. Antonsen Jr., O.V. Sinitsyn, J. Rodgers, A. Mohamed, J. Silverman, M. Al-Sheikhly, Y.S. Dimant, G.M. Milikh, M.Yu. Glyavin, A.G. Luchinin, E.A. Kopelovich, V.L. Granatstein. J. Infrared Milli Terahz Waves, 32 (3), 380 (2011). DOI: 10.1007/s10762-010-9708-y
  34. M.A. Dem'yanenko, V.V. Startsev. Tech. Phys., 67 (3), 347 (2022). DOI: 10.21883/TP.2022.03.53266.190-21
  35. V.Sh. Aliev, M.A. Dem'yanenko, D.G. Esaev, I.V. Marchishin, V.N. Ovsyuk, B.I. Fomin. Uspekhi prikladnoi fiziki, 1 (4), 471 (2013) (in Russian)
  36. M.A. Dem'yanenko, B.I. Fomin, L.L. Vasilieva, S.A. Volkov, I.V. Marchishin, D.G. Esaev, V.N. Ovsyuk, V.L. Dshkhunyan, E.B. Volodin, A.V. Ermolov, P.P. Usov, V.P. Chesnokov, Yu.S. Chetverov, P.N. Kudryavtsev, A.E. Zdobnikov, A.A. Ignatov. Prikladnaya fizika, 4, 124 (2010). (in Russian)
  37. N. Oda, H. Yoneyama, T. Sasaki, M. Sanoa, S. Kurashina, I. Hosako, N. Sekine, T. Sudoh, T. Irie. Proc. SPIE, 6940, 69402Y (2008). DOI: 10.1117/12.781630
  38. A.J.L. Adam, I. Kavsalynas, J.N. Hovenier, T.O. Klaassen, J.R. Gao, E.E. Orlova, B.S. Williams, S. Kumar, Q. Hu, J.L. Reno. Appl. Phys. Lett., 88 (15), 151105 (2006). DOI: 10.1063/1.2194889
  39. E.E. Orlova, J.N. Hovenier, T.O. Klaassen, I. Kavsalynas, A.J.L. Adam, J.R. Gao, T.M. Klapwijk, B.S. Williams, S. Kumar, Q. Hu, J.L. Reno. Phys. Rev. Lett., 96 (17), 173904 (2006). DOI: 10.1103/PhysRevLett.96.173904
  40. H. Wu, S. Grabarnik, A. Emadi, G. de Graaf, R.F. Wolffenbuttel. J. Micromech. Microeng., 19 (7), 074022 (2009). DOI: 10.1088/0960-1317/19/7/074022
  41. J. Dupuis, E. Fourmond, D. Ballutaud, N. Bererd, M. Lemiti. Thin Solid Films, 519 (4), 1325 (2010). DOI: 10.1016/j.tsf.2010.09.036
  42. M.A. Dem'yanenko. J. Opt. Technol., 84 (1), 34 (2017). DOI: 10.1364/JOT.84.000034

Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.

Дата начала обработки статистических данных - 27 января 2016 г.

Publisher:

Ioffe Institute

Institute Officers:

Director: Sergei V. Ivanov

Contact us:

26 Polytekhnicheskaya, Saint Petersburg 194021, Russian Federation
Fax: +7 (812) 297 1017
Phone: +7 (812) 297 2245
E-mail: post@mail.ioffe.ru