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The study of the phase noise of 89X nm-range single-mode intra-cavity contacted VCSELs
Bobrov M. A.
1, Blokhin S. A.
1, Kovach Ya. N.
1, Blokhin A. A.
1, Maleev N. A.
1, Kuzmenkov A. G.
1, Marchiy M. N.1, Vasyl’ev A. P.
2, Ustinov V. M.
1
1Ioffe Institute, St. Petersburg, Russia
2SHM R&E Center, RAS, Saint-Petersburg, Russia
2SHM R&E Center, RAS, Saint-Petersburg, Russia
Email: bobrov.mikh@gmail.com, blokh@mail.ioffe.ru, j-n-kovach@mail.ioffe.ru, aleksey.blokhin@mail.ioffe.ru, Maleev@beam.ioffe.ru, kuzmenkov@mail.ioffe.ru, mariamaleeva@yandex.ru, vasiljev@mail.ioffe.ru, vmust@beam.ioffe.ru
The study results of the phase noise spectral density measurements for the 89X nm-range single-mode VCSELs with the carrier injection through the intracavity contacts and low-Q doped DBRs are presented. The frequency-to-intensity fluctuations conversion in the optical discriminator was used to analyze the behavior of phase noise spectral density. Obtained results indicated that in the frequency range of 1-1000 Hz phase noise spectral density has the form of 1/f noise, while in the frequency range of 10-100 kHz the noise saturation is achieved at a level of (0.4-1)· 109 Hz2/Hz depending on the size of the current oxide aperture and mirror losses. Keywords: vertical-cavity surface-emitting laser, phase noise, atomic sensors.
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