Physics of the Solid State
To authors
Volumes and Issues
- 2024
- 2023
- 2022
Manipulating the Micromagnetic Structure of Multiphase CoPt Thin Films by Varying Layer Thicknesses
Dorokhin M. V.
1, Demina P. B.
1, Zdoroveyshchev A. V.
1, Zdoroveyshchev D. A.
1, Temiryazev A. G.1,2, Temiryazeva M.P.2, Kalent’eva I. L.
1, Trushin V. N.1
1Research Institute for Physics and Technology, Lobachevsky State University of Nizhny Novgorod, Nizhny Novgorod, Russia
2Fryazino Branch, Kotel’nikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences, Fryazino, Moscow oblast, Russia
2Fryazino Branch, Kotel’nikov Institute of Radio Engineering and Electronics, Russian Academy of Sciences, Fryazino, Moscow oblast, Russia
Email: dorokhin@nifti.unn.ru, demina@phys.unn.ru, zdorovei@nifti.unn.ru, daniel.zdorov@gmail.com, temiryazev@gmail.com, mtemiryazeva@gmail.com, istery@rambler.ru, trushin@phys.unn.ru
The magnetic properties and micromagnetic structure of [Co/Pt]10 multilayer magnetic films formed by independent variation of the Co and Pt layer thicknesses have been studied. The possibility of the film magnetization parameters manipulation was shown. It is found that the micromagnetic structure of the layers is significantly modified with a change in the thickness of the layers which correlates with the magnetization data. In particular, magnetic force microscopy revealed a system of magnetic skyrmions for a number of structures. The skyrmion density was found to be dependent on the growth conditions which in turn correlates with the shape of the magnetic hysteresis loop. Changing the thickness of the Co and Pt layers makes it possible to control the density of skyrmions in the range from 0.2 to 10.5 mkm-2. Keywords: micromagnetic structure, skyrmions, CoPt films, electron beam evaporation.
- L. Wang, C. Liu, N. Mehmood, G. Han, Y. Wang, X. Xu, C. Feng, Z. Hou, Y. Peng, X. Gao, G. Yu. ACS Appl. Mater. Interfaces 11, 12098 (2019)
- P. Vlaic, E. Burzo. J. Opt. Adv. Mater. 12, 5, 1114 (2010)
- J.B. Newkirk, R. Smoluchowski, A.H. Geisler, D.L. Martin. J. Appl. Phys. 22, 290 (1951)
- A.W. Rushforth, P.C. Main, B.L. Gallagher, C.H. Marrows, B.J. Hickey, E.D. Dahlberg, P. Eames. J. Appl. Phys. 89, 7534 (2001)
- A.V. Zdoroveyshchev, O.V. Vikhrova, P.B. Demina, M.V. Dorokhin, A.V. Kudrin, A.G. Temiryazev, M.P. Temiryazeva. Int. J. Nanosci. 18, 3-4, 1940019 (2019)
- A.G. Temiryazev, M.P. Temiryazeva, A.V. Zdoroveishchev, O.V. Vikhrova, M.V. Dorokhin, P.B. Demina, A.V. Kudrin. FTT 60, 11, 2158 (2018). (in Russian)
- A.G. Temiryazev, A.V. Zdoroveischev, M.P. Temiryazeva. Izv. RAN, Ser. fiz. 87, 3, 362 (2023). (In Russian)
- J.C. Woolley, J.H. Phillips, J.A. Clark. J. Less-Com. Met. 6, 461 (1964)
- N. Nagaosa, J. Sinova, S. Onoda, A.H. MacDonald, N.P. Ong. Rev. Mod. Phys. 82, 1539 (2010)
- M.V. Dorokhin, A.V. Zdoroveyshchev, M.P. Temiryazeva, A.G. Temiryazev, P.B. Demina, O.V. Vikhrova, A.V. Kudrin, I.L. Kalentyeva, M.V. Ved, A.N. Orlova, V.N. Trushin, A.V. Sadovnikov, D.A. Tatarskiy. J. All. Comp. 926, 166956 (2022)
- S.T. Ruggiero, A. Williams, C.E. Tanner, S. Potashnik, J. Moreland, W.H. Rippard. Appl. Phys. Lett. 82, 4599 (2003)
- Y. Yang, J.S. Chen, G.M. Chow. J. Appl. Phys. 109, 07B744 (2011)
Подсчитывается количество просмотров абстрактов ("html" на диаграммах) и полных версий статей ("pdf"). Просмотры с одинаковых IP-адресов засчитываются, если происходят с интервалом не менее 2-х часов.
Дата начала обработки статистических данных - 27 января 2016 г.