Optics and Spectroscopy
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- 2022
Analysis of the optical characteristics of dendritic Ag nanostructures on c-Si by spectroscopic ellipsometry
Bolshakov V.O.
1, Prigoda K. V.
1, Ermina A. A.
1, Markov D. P.
1, Zharova Yu. A.
1
1Ioffe Institute, St. Petersburg, Russia
Email: lion080895@gmail.com, kristinaprigoda@mail.ioffe.ru, annaermina97@gmail.com, danisimyss@gmail.com, piliouguina@mail.ioffe.ru
Dendritic silver nanostructures of different morphologies and heights from 210 to 1030 nm were obtained on the surfaces of silicon substrates using the method of chemical deposition from AgNO3 + HF solution. The Bruggeman, Tauc-Lorentz, Gauss and Drude models were used to analyze optical properties, layer thickness and filling factor when interpreting experimental ellipsometric data. As a result, good convergence of the experimental and calculated spectra of the real <ε_1> and imaginary <ε_2> parts of the complex pseudo-dielectric function <ε> was obtained. Keywords: spectroscopic ellipsometry, silver dendrites, silicon.
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