Modification of the structural properties of niobium thin films after hydrogenation
Salamatov Yu. A.1, Devyaterikov D. I.1, Makarova M. V.1, Matyukhov V. V.1, Ponosov Yu. S.1, Proglyado V. V.1, Tolmacheva E. A.1, Kravtsov E. A.1
1M.N. Mikheev Institute of Metal Physics, Ural Branch, Russian Academy of Sciences, Yekaterinburg, Russia
Email: salamatov@imp.uran.ru

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The relationships between the concentration of hydrogen absorbed in thin films of Al2O3//Nb type and the structural properties of these films have been established. The main research methods were X-ray diffraction and reflectometry. Structural changes after hydrogenation processes at various temperatures are analyzed. The hydrogenation conditions under which solid solutions of hydrogen in niobium and/or niobium hydrides are formed are specified. It is shown that it is possible to additionally control the concentration of hydrogen in niobium by applying a graphene layer to the film surface, obtaining an Al2O3//Nb/Gr type system. Being a kind of "anticatalytic layer", graphene significantly slows down the penetration of hydrogen into the sample, which makes it possible to obtain the necessary concentrations with high accuracy. Keywords: X-ray diffractometry, X-ray reflectometry, graphene, chemical vapor deposition, niobium hydrides, raman spectroscopy.
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