Photoelectrically Detected Magnetic Resonance Spectroscopy of the Excited Triplet States of Point Defects in Silicon
Выставление онлайн: 19 апреля 1999 г.
Highly sensitive methods of the detection of the electron paramagnetic resonance (EPR) spectra based on the spin-dependent microwave photoconductivity were applied for investigation of the structural defects in irradiated silicon. The parameters of the EPR spectra of the excited triplet states of radiation defects were determined and several models of the carbon related defects were supposed.
- C.A.J. Ammerlaan. Paramagnetic centers in silicon. In: Landolt--Bornstein Numerical Data and Functional Relationship in Science and Technology / Ed. by O. Madelung. Vol. 22 b, Impurity and Defects in Group IV Elements and III--V Compounds. Springer--Verlag, Berlin (1992). P. 365
- G.W. Ludwig, H.H. Woodbury. Electron Spin Reconance in Semiconductors. In: Solid State Physics / Ed. by F. Zeitz and D. Turnbull. Academic Press, N.Y. (1992). Vol. 13, p. 223
- G.D. Watkins. A Review of EPR Studies in Irradiated Silicon. In: Radiation Damage in Semiconductors / Ed. by P. Baruch. Dunod, Paris (1965). P. 97
- D.J. Lepine. Phys. Rev. B6, 436 (1972)
- L.S. Vlasenko, M.P. Vlasenko, V.N. Lomasov, V.A. Khramtsov. Sov. Phys. JETP 64, 612 (1986)
- L.S. Vlasenko. In: Semiconductor and Insulators: Optical and Spectroscopic Research. Nova Science Publishers, Inc., N.Y. (1992). P. 217--244
- M.P. Vlasenko, L.S. Vlasenko. Sov. Phys. Solid State 33, 1326 (1991)
- V.A. Khramtsov, V.N. Lomasov, Ya.Ya. Pilkevich, M.P. Vlasenko, L.S. Vlasenko. Phys. Stat. Sol. (a) 109, 127 (1988)
- L.S. Vlasenko, Y.V. Martynov, T. Gregorkiewicz, C.A.J. Ammerlaan. Phys. Rev. B52, 1144 (1995)
- R. Laiho, M.M. Afanasjev, M.P. Vlasenko, L.S. Vlasenko. Phys. Rev. Lett. 80, 1489 (1998)
- Y.H. Lee, J.W. Corbett. Phys. Rev. B13, 2653 (1976)
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